Description
The ZYGO ZMI-2002 8020-0211-1-J is a high-performance metrology instrument used for measuring surface roughness and waviness, as well as step height and other parameters critical to the manufacturing process.
Product Description
This precise and versatile instrument is designed to provide accurate and repeatable measurements of surface topography in a variety of applications, including semiconductor manufacturing, optics fabrication, and precision engineering.
Product Parameters and Specifications
Some of the key features and specifications of the ZYGO ZMI-2002 8020-0211-1-J include:
- Measurement range: 500 µm
- Vertical resolution: 0.06 nm
- Lateral resolution: 0.5 µm
- Measurement speed: up to 10 mm/s
- Repeatability: 0.03 nm
- Form deviation: < 10 nm
- Surface roughness: Ra < 0.1 nm
- Wavelength range: 0.1 to 6 mm
- Light source: LED
- Sample size: up to 150 mm diameter
This instrument is also equipped with advanced software for data analysis and visualization, and can be easily integrated into existing manufacturing processes for increased efficiency and quality control.
Whether you are working in research and development or production, the ZYGO ZMI-2002 8020-0211-1-J is the ideal tool for precise and reliable surface metrology.
